• Devices QML Qualified in Accordance with MIL-PRF-38535
• Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96705 and Intersil’s QM Plan
• 1.25 Micron Radiation Hardened SOS CMOS
• Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 300K RAD (Si)
• Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day(Typ)
• SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . 100 MEV-cm2/mg
• Dose Rate Upset . . . . . . . . . . . . . . . . 1011 RAD (Si)/s, 20ns Pulse
• Dose Rate Survivability . . . . . . . . . . . 1012 RAD (Si)/s, 20ns Pulse
• Latch-Up Free Under Any Conditions
• Military Temperature Range . . . . . . . . . . . . . . . . . . -55oC to +125oC
• Significant Power Reduction Compared to ALSTTL Logic
• DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
• Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
• Input Current≤1µA at VOL, VOH
• Fast Propagation Delay . . . . . . . . . . . . . . . . 15ns (Max), 10ns (Typ)